Skip navigation

Items where Author is "Ahsan, M."

Items where Author is "Ahsan, M."

[up] Up a level
Group by: Item Type | Uncontrolled Keywords | No Grouping
data analysis data-driven prognostics electronics manufacturing machine learning modelling qualification testing quality
Number of items: 7.

data analysis

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

data-driven prognostics

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

electronics manufacturing

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

machine learning

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

modelling

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

qualification testing

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

quality

Ahsan, M., Stoyanov, S. ORCID logoORCID: https://orcid.org/0000-0001-6091-1226, Bailey, C. ORCID logoORCID: https://orcid.org/0000-0002-9438-3879 and Albarbar, A. (2020) Developing computational intelligence for smart qualification testing of electronic products. IEEE Access, 8. pp. 16922-16933. ISSN 2169-3536 (Online) (doi:10.1109/ACCESS.2020.2967858)

This list was generated on Sun Dec 22 13:17:52 2024 UTC.