Alan Turing Institute

Fu, Anqi, Tomic, Ivana ORCID: 0000-0003-3502-5980 and McCann, Julie A. (0219) Asynchronous sampling for decentralized periodic event-triggered control. In: 2019 American Control Conference (ACC). IEEE, pp. 145-150. ISBN 978-1538679012 ISSN 0743-1619 (Print), 2378-5861 (Online)

CISCO Research Centre/Silicon Valley Community Foundation

Tomic, Ivana ORCID: 0000-0003-3502-5980 , Bhatia, Laksh, Breza, Michael J. and McCann, Julie A. (2018) The limits of LoRaWAN in event-triggered wireless networked control systems. In: 2018 UKACC 12th International Conference on Control (CONTROL). IEEE, pp. 101-106. ISBN 978-1538628645 (doi:https://doi.org/10.1109/CONTROL.2018.8516774)

EPSRC

Fu, Anqi, Tomic, Ivana ORCID: 0000-0003-3502-5980 and McCann, Julie A. (0219) Asynchronous sampling for decentralized periodic event-triggered control. In: 2019 American Control Conference (ACC). IEEE, pp. 145-150. ISBN 978-1538679012 ISSN 0743-1619 (Print), 2378-5861 (Online)

Engineering and Physical Sciences Research Council

Tomic, Ivana ORCID: 0000-0003-3502-5980 and McCann, Julie A. (2017) A survey of potential security issues in existing wireless sensor network protocols. IEEE Internet of Things Journal, 4 (6). pp. 1910-1923. ISSN 2327-4662 (Print), 2327-4662 (Online) (doi:https://doi.org/10.1109/JIOT.2017.2749883)

European Union’s Horizon 2020 research and innovation programme (Grant Agreement No. 883242)

Khan, Taimoor ORCID: 0000-0002-5752-6420 and Tomic, Ivana ORCID: 0000-0003-3502-5980 (2020) Securing industrial cyber-physical systems: A run-time multi-layer monitoring. IEEE Transactions on Industrial Informatics, 17 (9). pp. 6251-6259. ISSN 1551-3203 (Print), 1941-0050 (Online) (doi:https://doi.org/10.1109/TII.2020.3032968)

The Engineering and Physical Sciences Research Council (EPSRC)

Bhatia, Laksh, Tomić, Ivana ORCID: 0000-0003-3502-5980 and McCann, Julie A. (2018) LPWA-MAC: a low power ride area network MAC protocol for cyber-physical systems. In: Proceedings of the 16th ACM Conference on Embedded Networked Sensor Systems - SenSys '18. ACM, New York, NY, USA, pp. 361-362. ISBN 978-1450359528 (doi:https://doi.org/10.1145/3274783.3275183)