Items where Greenwich Author is "Rosunally, Yasmine"
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Cutty Sark, prognostics framework, data-driven prognostics, computer modelling, physics-of-failure, PoF
Rosunally, Yasmine, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Bailey, Chris ORCID: 0000-0002-9438-3879 , Mason, Peter, Campbell, Sheelagh, Monger, George and Bell, Ian (2009) Development of a prognostics framework for the iron structural material of the s.v. Cutty Sark. In: Proceedings of Sixth International Conference on Condition Monitoring and Machinery Failure Prevention Technologies – CM/MFPT 2009. The British Institute of Non-Destructive Testing / Coxmoor Publishing, Northampton, UK, pp. 674-685.
data driven prognostics, health monitoring, light emitting diodes, LEDs
Sutharssan, Thamo, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Bailey, Christopher ORCID: 0000-0002-9438-3879 and Rosunally, Yasmine (2012) Prognostics and health monitoring of high power LED. Micromachines, 3 (1). pp. 78-100. ISSN 2072-666X (doi:https://doi.org/10.3390/mi3010078)
data driven prognostics, prognostics health management, PHM, light emitting diodes, LEDs
Sutharssan, T., Stoyanov, S. ORCID: 0000-0001-6091-1226 , Bailey, C. ORCID: 0000-0002-9438-3879 and Rosunally, Y. (2012) Data analysis techniques for real-time prognostics and health management of semiconductor devices. In: Microelectronics and Packaging. Institute of Electrical and Electronic Engineers, Inc, Piscataway, NJ, USA, pp. 1-7. ISBN 978-1-4673-0694-2 (print)
model-driven prognostics, data-driven prognostics, aged iron structures, Cutty Sark, conservation, diagnostic techniques, computer modelling,
Rosunally, Yasmine Zaina (2012) Diagnostic and prognostic analysis tools for monitoring degradation in aged structures. PhD thesis, University of Greenwich.
probabilities, prognostics framework, computer modelling, Cutty Sark, conservation
Rosunally, Y.Z., Stoyanov, S. ORCID: 0000-0001-6091-1226 , Bailey, C. ORCID: 0000-0002-9438-3879 , Mason, P., Campbell, S., Monger, G. and Bell, I. (2011) Fusion approach for prognostics framework of heritage structure. IEEE Transactions on Reliability, 60 (1):570453. pp. 3-13. ISSN 0018-9529 (doi:https://doi.org/10.1109/TR.2011.2104451)
prognostics framework, Bayesian networks, computer modelling, Cutty Sark, conservation, physics-of-failure,
Rosunally, Yasmine, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Bailey, Christopher ORCID: 0000-0002-9438-3879 , Mason, Peter, Campbell, Sheelagh, Monger, George and Bell, Ian (2010) Bayesian networks for predicting remaining life. International Journal of Performability Engineering, 6 (5). pp. 499-512. ISSN 0973-1318
prognostics framework, computer modelling, Cutty Sark, conservation, heritage structures,
Rosunally, Yasmine, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Bailey, Christopher ORCID: 0000-0002-9438-3879 , Mason, Peter, Campbell, Sheelagh, Monger, George and Bell, Ian (2010) Fusion approach for predictive maintenance of heritage structures. Prognostics & Health Management Conference, 2010, PHM '10. IEEE Conference Publications . IEEE, pp. 1-6. ISBN 978-1-4244-4756-5 (print), 978-1-4244-4758-9 (e-book) (doi:https://doi.org/10.1109/PHM.2010.5413403)
prognostics framework, computer modelling, materials damage, material degradation, prognostic fusion, Cutty Sark, heritage structure, conservation,
Rosunally, Yasmine, Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 , Bailey, Christopher ORCID: 0000-0002-9438-3879 , Mason, Peter, Campbell, Sheelagh and Monger, George (2009) Prognostics framework for remaining life prediction of Cutty Sark iron structures. Annual Conference of the Prognostics and Health Management Society 2009. Prognostics and Health Management Society, 6 pages.
prognostics, reliability, light emitting diodes, LEDs, algorithms
Sutharssan, Thamo, Bailey, Chris ORCID: 0000-0002-9438-3879 , Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 and Rosunally, Yasmine (2011) Prognostics and reliability assessment of light emitting diode packaging. In: Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2011 12th International Conference on. Institute of Electrical and Electronics Engineers, Piscataway, NJ, USA, pp. 1-7. ISBN 978-1-4577-1770-3 (print), 978-1-4577-1768-0 (eISBN) (doi:https://doi.org/10.1109/ICEPT.2011.6066984)