Skip navigation

Integration of analytical techniques in stochastic optimization of microsystem reliability

Integration of analytical techniques in stochastic optimization of microsystem reliability

Xue, Xiangdong, Bailey, Chris ORCID: 0000-0002-9438-3879, Lu, Hua ORCID: 0000-0002-4392-6562 and Stoyanov, Stoyan ORCID: 0000-0001-6091-1226 (2011) Integration of analytical techniques in stochastic optimization of microsystem reliability. Microelectronics Reliability, 51 (5). pp. 936-945. ISSN 0026-2714 (doi:https://doi.org/10.1016/j.microrel.2011.01.008)

Full text not available from this repository.

Abstract

This paper presents an integrative application of several numerical analytical techniques and associated analysis tools for design optimization and damage prediction in electronics packages and microsystems. This design-for-reliability approach is based on four different types of numerical techniques that allow (1) high-fidelity modelling, (2) reduced order modelling, (3) numerical optimization and (4) uncertainty analysis. The capabilities and the characteristics of the methods that underpin these four types of modelling and analysis tools are firstly investigated. The integration of the methods and tools is then examined and a methodology for coupling the tools in an optimization process is proposed. This numerical methodology involves the following steps: (1) Define sampling points for the design of interest by design of experiments (DOE) and calculate the design response at each DOE point using high-fidelity analysis; (2) construct reduced order models (ROM) for fast analysis using the obtained response values at the DOE points; (3) Undertake deterministic optimization in the defined design space by ROM; and (4) Probabilistic optimization by including variation and uncertainty of the design in the optimization task. This approach is suitable to address design-for-reliability requirements at early design stages in a wide range of application areas. The application of this approach is demonstrated in a case for minimizing the thermal fatigue damage of flip-chip solder interconnects. Design modifications show that this approach can provide improved reliability of the package and in the same time satisfy a number of design requirements.

Item Type: Article
Additional Information: [1] First available online: 12 February 2011. [2] Published in print: May 2011. [3] Published as: Microelectronics Reliability, (2011), Vol. 51, (5), pp. 936–945.
Uncontrolled Keywords: microsystems, multiphysics, analytical techniques
Subjects: T Technology > TK Electrical engineering. Electronics Nuclear engineering
Pre-2014 Departments: School of Computing & Mathematical Sciences
School of Computing & Mathematical Sciences > Centre for Numerical Modelling & Process Analysis > Computational Mechanics & Reliability Group
Related URLs:
Last Modified: 20 Mar 2019 11:54
Selected for GREAT 2016: None
Selected for GREAT 2017: None
Selected for GREAT 2018: None
Selected for GREAT 2019: None
URI: http://gala.gre.ac.uk/id/eprint/6760

Actions (login required)

View Item View Item