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Kao, A. ORCID: 0000-0002-6430-2134, Shevchenko, N., Alexandrakis, M., Krastins, I., Eckert, S. and Pericleous, K. ORCID: 0000-0002-7426-9999 (2018) Thermal dependence of large scale freckle defect formation. Philosophical Transactions A: Mathematical, Physical and Engineering Sciences. ISSN 1364-503X (Print), 1471-2962 (Online) (In Press)

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